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| Analysis computer - AP Suite 6.3 | 902 | No fee tool or analysis computer | Katarina Logg | A | Computer | Computer |
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| Analysis computer - AP Suite 6.3 (2nd) | 903 | No fee tool or analysis computer | Katarina Logg | A | Computer | Computer |
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| Analysis computer - AZtec GMS JEMS | 905 | No fee tool or analysis computer | Stefan Gustafsson | A | Computer | Computer |
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| Analysis computer - IVAS 3.6 | 901 | No fee tool or analysis computer | Katarina Logg | A | Computer | Computer |
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| Analysis computer - SurfaceLab | 906 | No fee tool or analysis computer | Elias Ranjbari | A | IONTOF | TOF.SIMS 5 |
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| Atom Probe - Cameca LEAP 6000 XR | 306 | APT | Katarina Logg | N | Cameca/Ametek | LEAP 6000 XR |
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| BIB - Hitachi ArBlade 5000 | 407 | Samples prep with fees | Stefan Gustafsson | E | Hitachi | ArBlade 5000 |
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| BIB - Leica TIC3X | 405 | Samples prep with fees | Stefan Gustafsson | E | Leica | TIC3X |
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| FIB - FEI Versa3D | 404 | FIB-SEM | Ludvig de Knoop | J | FEI | Versa 3D LoVac |
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| FIB - Tescan GAIA3 | 406 | FIB-SEM | Stefan Gustafsson | J | Tescan | GAIA3 |
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| FTIR microscope/spectrometer - Bruker Hyperion3000/Vertex70v | 702 | Optical microscopes/spectrometers | Katarina Logg | C | Bruker | Hyperion3000/Vertex70v |
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| Ion Miller - Fischione 1010 | 403 | Samples prep with fees | Ludvig de Knoop | A | Fischione | 1010 IonMill HighMag |
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| Momentum Transfer services | 904 | X-ray techniques | Michal Strach | I | Momentum Transfer | 1 |
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| Raman microscope - WITec alpha300 R | 701 | Optical microscopes/spectrometers | Katarina Logg | C | WITec | alpha300 R |
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| Sample Preparation - Leica EM TXP | 802 | No fee tool or analysis computer | Stefan Gustafsson | A | Leica | EM TXP |
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| Saw - BUEHLER Low Speed Saw | 801 | No fee tool or analysis computer | Stefan Gustafsson | A | BUEHLER | 11-1280-250 |
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| SAXS - SAXSLAB Mat:Nordic | 302 | X-ray techniques | Michal Strach | F | SAXSLAB / Xenocs | Mat:Nordic |
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| SCXRD - Rigaku Synergy R | 305 | X-ray techniques | Michal Strach | G | Rigaku | XtaLAB Synergy-R |
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| SEM - FEI Quanta 200 FEG ESEM | 101 | SEM | Stefan Gustafsson | H | FEI | Quanta 200 FEG ESEM |
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| SEM - Hitachi TM4000 Plus | 104 | SEM | Ludvig de Knoop | H | Hitachi | TM4000 Plus |
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| SEM - JEOL 7800F Prime | 103 | SEM | Stefan Gustafsson | H | JEOL | JSM 7800F Prime |
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| SEM - Zeiss Ultra 55 FEG | 102 | SEM | Ludvig de Knoop | H | Zeiss | Ultra 55 FEG SEM |
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| TEM - FEI Tecnai T20 LaB6 | 203 | TEM | Ludvig de Knoop | I | FEI | Tecnai T20 LaB6 |
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| TEM - FEI Titan 80-300 | 202 | TEM | Ludvig de Knoop | L | FEI | Titan 80-300 |
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| TEM - JEOL NeoARM200F - Mono 40-200 | 204 | TEM | Stefan Gustafsson | M | JEOL | ARM 200F Mono |
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| TOF-SIMS - IONTOF TOF-SIMS 5 | 307 | TOF-SIMS | Elias Ranjbari | N | IONTOF | TOF.SIMS 5 |
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| XRD - Bruker D8 Advance | 303 | X-ray techniques | Michal Strach | D | Bruker | D8 Advance |
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| XRD - Bruker D8 Discover | 304 | X-ray techniques | Michal Strach | F | Bruker | D8 Discover |